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Req. ID: 131834
We are seeking for motivated individuals to join the NVE PE Reliability team
working as an Ambyx Reliability Engineer. In this position- you will be
responsible for design- develop and maintain NAND reliability test programs.
You will be working closely with NAND product- R & D- Global Quality and
Operation teams to evaluate NAND products in all reliability aspects during
new product development phase.
Your main responsibilities include:
Develop reliability stress and testing methodology for NAND product
Develop and maintain NAND product reliability and characterization test programs
Working with product reliability engineers to define reliability test flows for individual product
Provide support to operation team to ensure seamless execution for generated test flow on the tester with live produc
Perform electrical failure analysis for failure validation and characterizatio
Contribute to burn-in board design and software development
The ideal candidate should have a good mix of understanding Flash memory
reliability testing requirements and software background in C++/Python.
Understand of Automate Test Equipment and specifically Ambyx is a plus.
You are encouraged to apply if you could demonstrate some of the qualities
listed below:
Master|s or Bachelor|s degree in Engineering filed. Microelectronic/Electrical/Computer Engineering fields are preferred.
Good understanding of Automated Test Equipment for Reliability testing (Ambyx 6).
Good understanding of NAND flash memory Reliability failure mechanisms and Testing methodology.
Hands on experience with C++/Python and Object-Oriented Programming
Positive attitude and self-motivation towards learning and development.
Good analytical mindset and structured personality.
Good written and verbal communication skills.
Location: 990 Bendemeer Road- Singapore 339942
All qualified applicants will receive consideration for employment without
regard to race- color- religion- sex- sexual orientation- gender identity-
national origin- veteran or disability status.